Aehr Test Systems to Present at Needham Growth Conference

Reuters01-06 20:30

<a href="https://laohu8.com/S/AEHR">Aehr Test Systems</a> to Present at Needham Growth Conference

Aehr Test Systems, a global supplier of semiconductor test and burn-in solutions, will present at the 28th Annual Needham Growth Conference in New York on January 13. President and CEO Gayn Erickson and CFO Chris Siu are scheduled to speak at 1:30 pm ET and will meet with institutional investors throughout the day. A live or replay webcast of the presentation will be available through the investor relations section of Aehr's website.

Disclaimer: This news brief was created by Public Technologies (PUBT) using generative artificial intelligence. While PUBT strives to provide accurate and timely information, this AI-generated content is for informational purposes only and should not be interpreted as financial, investment, or legal advice. Aehr Test Systems published the original content used to generate this news brief via ACCESS Newswire (Ref. ID: 1122879) on January 06, 2026, and is solely responsible for the information contained therein.

Disclaimer: Investing carries risk. This is not financial advice. The above content should not be regarded as an offer, recommendation, or solicitation on acquiring or disposing of any financial products, any associated discussions, comments, or posts by author or other users should not be considered as such either. It is solely for general information purpose only, which does not consider your own investment objectives, financial situations or needs. TTM assumes no responsibility or warranty for the accuracy and completeness of the information, investors should do their own research and may seek professional advice before investing.

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