- Bruker accelerated development of photothermal AFM-IR spectroscopy to expand nanoIR use in semiconductor research.
- Company installed Dimension IconIR system at imec under a joint development project to evaluate nanoscale chemical characterization for advanced process and device work.
- Program targets sub-5-nanometer, label-free chemical analysis to support research on EUV photoresists and other next-generation materials.
Disclaimer: This news brief was created by Public Technologies (PUBT) using generative artificial intelligence. While PUBT strives to provide accurate and timely information, this AI-generated content is for informational purposes only and should not be interpreted as financial, investment, or legal advice. Bruker Corporation published the original content used to generate this news brief via Business Wire (Ref. ID: 20260407364625) on April 07, 2026, and is solely responsible for the information contained therein.
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